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Fabrication and Characterization of Nanostructures Using AFM
Online Presentations | 26 Feb 2022 | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network
The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...
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Characterization - Atomic Force Microscopy
Online Presentations | 12 Jan 2022 | Contributor(s):: Wesley C. Sanders, NACK Network
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Symposium on Nanomaterials for Energy: Atomic Force Microscopy for Energy Applications - A Review
Online Presentations | 05 Feb 2021 | Contributor(s):: Arvind Raman
Atomic Force Microscopy is unique in its ability to measure sub -nanonewton forces arising from a variety physical phenomena between a sharp tip and a sample. In this talk we review the most recent applications of atomic force microscopy to explore and characterize quantitatively the properties...
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Nanotechnology Workshops at Northwest Vista College - Nanotechnology Workshop for High School Students and High School Educators
Online Presentations | 26 Oct 2020 | Contributor(s):: Neda Habibi, Jared Ashcroft (editor), The Micro Nano Technology - Education Center
Northwest Vista College will host it’s fourth summer Nanotechnology workshop for high school students and high school educators in summer 2021. ...
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Quantum-Enhanced Imaging for Advanced Characterization
Online Presentations | 21 Jan 2020 | Contributor(s):: Raphael C. Pooser
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Fundamentals of Metrology and Characterization for Nanotechnology
Online Presentations | 13 Mar 2019 | Contributor(s):: Diane Hickey-Davis, NACK Network
Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it
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3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
Online Presentations | 31 Jan 2019 | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
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Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”
Online Presentations | 11 Nov 2018 | Contributor(s):: Stanislav Leesment
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.
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Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes
Online Presentations | 11 Nov 2018 | Contributor(s):: Stanislav Leesment
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.
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Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode
Online Presentations | 11 Nov 2018 | Contributor(s):: Stanislav Leesment
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.
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Advanced Scanning Probe Microscopy I
Online Presentations | 01 Oct 2018 | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
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Advanced Scanning Probe Microscopy II
Online Presentations | 01 Oct 2018 | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
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The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
Online Presentations | 20 Jul 2018 | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves
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Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics
Online Presentations | 08 Dec 2017 | Contributor(s):: Roger Proksch
In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...
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[Illinois] Interphase Chemical Mapping Of Carbon Fiber-epoxy Composites By AFM-IR Spectroscopy
Online Presentations | 13 Apr 2017 | Contributor(s):: Chris Montgomery
The properties and performance of carbon fiber reinforced polymer matrix composites are highly influenced by the chemical interactions of the fiber/matrix interface region. Many researchers have hypothesized that the presence of carbon fibers in epoxy causes a chemical gradient to form around the...
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High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control
Online Presentations | 19 Sep 2016 | Contributor(s):: Ryan (Young-kook) Yoo
Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal behavior, inadequate to address the metrology needs of industrial applications: accuracy,...
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[Illinois] AMC 2016 workshop: Quantitative AM-FM mode for fast and versatile imaging of nanoscale elastic modulus
Online Presentations | 13 Jun 2016 | Contributor(s):: Marta Kocun
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
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[Illinois] AMC 2016 workshop: In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force microscope
Online Presentations | 13 Jun 2016 | Contributor(s):: Song Xu
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
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[Illinois] AFM indentation tests reveal the poroelastic nature of the cytoplasm
Online Presentations | 19 Nov 2015 | Contributor(s):: Emad Moeendarbary
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[Illinois] GEM4 2012: 3D Microscopy, Confocal, Multiphoton & SHG Microscopy
Online Presentations | 29 Dec 2012 | Contributor(s):: Peter So
Our objective is to educate researchers and graduate students about the fundamentals of cell and molecular biomechanics, and to provide an intense learning experience, and to facilitate interactions among engineers, biologists and clinicians. The goals are to help train a new generation of...