Outline:

• How do we see what we can’t see?
• Five common nanotech instruments
• For each, I’ll cover:
  • What it does
  • How it works
  • Where it’s used in Industry
  • What subjects you can teach with it
  • What skills your students can learn from it

Researchers should cite this work as follows:

• Diane Hickey-Davis, NACK Network (2019), "Fundamentals of Metrology and Characterization for Nanotechnology," https://nanohub.org/resources/30128.

  BibTex | EndNote

1. ATE Centers
2. atomic force microscopy (AFM)
3. characterization
4. electron microscopy
5. failure analysis
6. metrology
7. microscopy
8. NACK Network
9. optical microscopy
10. scanning electron microscopy (SEM)
11. transmission electron microscopy (TEM)