Advanced Scanning Probe Microscopy I

By Sebastien Maeder1; NACK Network2

1. Pennsylvania State University, State College, PA 2. Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

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Abstract

Outline

  • Part 1: This Lecture
    • Overview of Scanning Probe Techniques
    • Scanning Tunneling Microscopy
    • Atomic Force Microscopy
      • Hardware and Components
      • Tip/Sample Interactions
  • Part 2: Can be viewed here
      • Common Modes of Operation
      • Pitfalls and Image Artifacts
    • Example of Instrument Operation

Sponsored by

The Nanotechnology Applications and Career Knowledge (NACK) Network

Funded, in part, by a grant from the National Science Foundation. DUE 1205105

Cite this work

Researchers should cite this work as follows:

  • Sebastien Maeder, NACK Network (2018), "Advanced Scanning Probe Microscopy I," https://nanohub.org/resources/28979.

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Tags

  1. ATE Centers
  2. atomic force microscopy (AFM)
  3. materials science
  4. microscopy
  5. NACK Network
  6. NCN Group - Characterization and Metrology
  7. scanning probe microscopy (SPM)
  8. scanning tunneling microscopy (STM)