Advanced Scanning Probe Microscopy I

By Sebastien Maeder1; NACK Network2

1. Pennsylvania State University, State College, PA 2. Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

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Abstract

Outline

  • Part 1: This Lecture
    • Overview of Scanning Probe Techniques
    • Scanning Tunneling Microscopy
    • Atomic Force Microscopy
      • Hardware and Components
      • Tip/Sample Interactions
  • Part 2: Can be viewed here
      • Common Modes of Operation
      • Pitfalls and Image Artifacts
    • Example of Instrument Operation

Sponsored by

The Nanotechnology Applications and Career Knowledge (NACK) Network

Funded, in part, by a grant from the National Science Foundation. DUE 1205105

Cite this work

Researchers should cite this work as follows:

  • Sebastien Maeder, NACK Network (2018), "Advanced Scanning Probe Microscopy I," https://nanohub.org/resources/28979.

    BibTex | EndNote

Tags

  1. ATE Centers
  2. atomic force microscopy (AFM)
  3. materials science
  4. microscopy
  5. NACK Network
  6. NCN Group - Characterization and Metrology
  7. scanning probe microscopy (SPM)
  8. scanning tunneling microscopy (STM)
Advanced Scanning Probe Microscopy I
  • Advanced Scanning Probe Microscopy I 1. Advanced Scanning Probe Micros… 0
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  • Outline 2. Outline 28.828828828828829
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  • Characterization on the Nanoscale 3. Characterization on the Nanosc… 48.815482148815484
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  • Timeline of Nanocharacterization 4. Timeline of Nanocharacterizati… 96.663329996663336
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  • A Sample of SPM Techniques 5. A Sample of SPM Techniques 150.78411745078412
    00:00/00:00
  • A Sample of SPM Techniques 6. A Sample of SPM Techniques 211.21121121121121
    00:00/00:00
  • Outline 7. Outline 236.90357023690359
    00:00/00:00
  • Scanning Tunneling Microscopy 8. Scanning Tunneling Microscopy 244.77811144477812
    00:00/00:00
  • Scanning Tunneling Microscopy 9. Scanning Tunneling Microscopy 275.20854187520854
    00:00/00:00
  • Scanning Tunneling Microscopy 10. Scanning Tunneling Microscopy 353.68702035368705
    00:00/00:00
  • How Can Tunnel Current Be Used? 11. How Can Tunnel Current Be Used… 393.86052719386055
    00:00/00:00
  • STM: Principle of Operation 12. STM: Principle of Operation 462.19552886219554
    00:00/00:00
  • Scanning Tunneling Microscopy 13. Scanning Tunneling Microscopy 515.24858191524856
    00:00/00:00
  • STM: Principle of Operation 14. STM: Principle of Operation 545.41207874541215
    00:00/00:00
  • STM: What can be measured? 15. STM: What can be measured? 585.985985985986
    00:00/00:00
  • STM: What can be measured? 16. STM: What can be measured? 635.23523523523522
    00:00/00:00
  • Current Imaging Tunneling Spectroscopy (CITS) 17. Current Imaging Tunneling Spec… 674.60794127460792
    00:00/00:00
  • STM: Requirements and Limitations 18. STM: Requirements and Limitati… 729.49616282949614
    00:00/00:00
  • STM: Requirements and Limitations 19. STM: Requirements and Limitati… 831.16449783116457
    00:00/00:00
  • Scanning Tunneling Microscopy 20. Scanning Tunneling Microscopy 855.65565565565566
    00:00/00:00
  • STM: Requirements and Limitations 21. STM: Requirements and Limitati… 886.95362028695365
    00:00/00:00
  • Interesting Surfaces for STM 22. Interesting Surfaces for STM 935.83583583583584
    00:00/00:00
  • Outline 23. Outline 1001.5015015015016
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  • From STM to AFM 24. From STM to AFM 1025.4587921254588
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  • From STM to AFM 25. From STM to AFM 1071.6383049716383
    00:00/00:00
  • Atomic Force Microscopy (AFM) 26. Atomic Force Microscopy (AFM) 1134.1341341341342
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  • Atomic Force Microscopy 27. Atomic Force Microscopy 1181.3480146813481
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  • Outline 28. Outline 1248.6820153486822
    00:00/00:00
  • Principle of Operation 29. Principle of Operation 1254.9549549549549
    00:00/00:00
  • Principle of Operation 30. Principle of Operation 1370.9709709709709
    00:00/00:00
  • Hardware and Components 31. Hardware and Components 1401.801801801802
    00:00/00:00
  • AFM Tip Technology 32. AFM Tip Technology 1425.2252252252254
    00:00/00:00
  • AFM Tip Technology 33. AFM Tip Technology 1479.512846179513
    00:00/00:00
  • AFM Tip Technology 34. AFM Tip Technology 1552.0186853520188
    00:00/00:00
  • FESEM image of typical tip/cantilever 35. FESEM image of typical tip/can… 1562.6626626626628
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  • Detecting Cantilever Deflection 36. Detecting Cantilever Deflectio… 1570.4037370704039
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  • AFM Optical Lever 37. AFM Optical Lever 1599.9332665999334
    00:00/00:00
  • AFM Optical Lever 38. AFM Optical Lever 1628.2949616282949
    00:00/00:00
  • Photodiode Detector 39. Photodiode Detector 1692.9262595929263
    00:00/00:00
  • Photodiode Detector 40. Photodiode Detector 1734.7013680347016
    00:00/00:00
  • Piezoelectric Scanner 41. Piezoelectric Scanner 1756.7233900567235
    00:00/00:00
  • Piezoelectric Scanner 42. Piezoelectric Scanner 1807.0070070070071
    00:00/00:00
  • Positioning the Sample 43. Positioning the Sample 1833.1664998331667
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  • Positioning the Sample 44. Positioning the Sample 1878.8455121788456
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  • Feedback Loop 45. Feedback Loop 1900.1001001001002
    00:00/00:00
  • Feedback Loop 46. Feedback Loop 1990.3903903903904
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  • Feedback Loop: PID Control 47. Feedback Loop: PID Control 2025.7590924257593
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  • Feedback Loop: PID Control 48. Feedback Loop: PID Control 2060.7941274607942
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  • Tuning the Feedback Loop 49. Tuning the Feedback Loop 2122.5225225225226
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  • Outline 50. Outline 2185.2852852852852
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  • Bonding and Forces Revisited 51. Bonding and Forces Revisited 2192.7927927927931
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  • Tip-Sample Interactions 52. Tip-Sample Interactions 2223.1564898231568
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  • Tip-Sample Interactions 53. Tip-Sample Interactions 2275.0417083750417
    00:00/00:00
  • Lennard-Jones Potential 54. Lennard-Jones Potential 2400
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  • Tip-Sample Interactions 55. Tip-Sample Interactions 2437.3707040373706
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  • Tip-Sample Interactions 56. Tip-Sample Interactions 2484.1174507841174
    00:00/00:00
  • Tip-Sample Interactions 57. Tip-Sample Interactions 2530.830830830831
    00:00/00:00
  • Cantilever Spring Constant 58. Cantilever Spring Constant 2543.9105772439107
    00:00/00:00
  • AFM Signals and Measurements 59. AFM Signals and Measurements 2562.9963296629962
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  • Force-Distance Curves 60. Force-Distance Curves 2598.1314647981317
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  • Principle of Operation 61. Principle of Operation 2688.9556222889555
    00:00/00:00
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