The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

By Stephen J. Fonash1; NACK Network2

1. Engineering Sciences, Pennsylvania State University, State College, PA 2. Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

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Abstract

Outline

  • The tools for characterizing materials and structures at the nano-scale
  • Probes
  • Photon beams
  • Electron beams
  • Ion beams
  • Acoustic waves

Cite this work

Researchers should cite this work as follows:

  • Stephen J. Fonash, NACK Network (2018), "The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale," https://nanohub.org/resources/28741.

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Tags

  1. ATE Centers
  2. atomic force microscopy (AFM)
  3. characterization
  4. electron microscopy
  5. fluorescence imaging
  6. focused ion beams
  7. ion beams
  8. mass spectroscopy
  9. microscopy
  10. NACK Network
  11. Nearfield Scanning Optical Microscopy
  12. profilometry
  13. Raman Spectroscopy
  14. scanning electron microscopy (SEM)
  15. scanning tunneling microscopy (STM)
  16. secondary ion mass specroscopy (SIMS)
  17. Spectroscopy
  18. X-Ray Photoelectron Spectroscopy (XPS)