Tags: profilometry

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  1. Basic Characterization Techniques

    Online Presentations | 24 Aug 2018 | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

  2. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    Online Presentations | 20 Jul 2018 | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  3. Sean M Rinehart

    https://nanohub.org/members/130456