NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. Topics will include:

• Introduction to resonant AFM modes and a survey of their applications.
• Quantitative nano-mechanical measure- ments and nano-manipulation, including HybriD mode.

Outline:

Part I – Introduction and “Getting in Contact”

• AFM operational principles
• 3 main ways AFM interacts with the surface
• Contact mode related AFM techniques

Part II – Resonance Oscillatory Modes

• Approach of resonant interaction
• Tapping Mode – a “good child”
• Tips for getting a perfect image in Tapping
• Tapping-related AFM techniques
• Tracking the frequency

Part III – Non-Resonant Oscillatory HybriD Mode

• Tracking the topography
• QNM – Quantitative Mechanical Mapping
• HybriD Mod related AFM techniques
• Few words about Optics

Birck Nanotechnology Center

Researchers should cite this work as follows:

• Stanislav Leesment (2018), "Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”," https://nanohub.org/resources/29172.

  BibTex | EndNote

1. atomic force microscopy (AFM)
2. from outside
3. materials science
4. NCN
5. NCN Group - Characterization and Metrology