nanoHUB.org - Resources: Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”: Supporting Docs

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Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”

By Stanislav Leesment

NT-MDT Spectrum Instruments, Moscow, Russia

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Additional materials available (4)

Supporting Docs

(HTML5)Presentation (with video)
(PDF, 3.95 MB)Presentation Slides
(MP4, 58.08 MB)Podcast (HD video)
(MP3, 13.90 MB)Podcast (audio)