Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)
Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)
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1. Negative Bias Temperature Inst…
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2. Outline
22.559999465942383
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3. Outline
142.1309986114502
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4. NBTI Experimental Signatures (…
147.03199863433838
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5. NBTI Experimental Signatures (…
251.54300022125244
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6. NBTI Degradation Model
342.7529993057251
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7. H-H2 Reaction Diffusion (R-D) …
487.94399356842041
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8. Physics of Reaction (Breaking …
560.93399143218994
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9. H – H2 RD Model: Mathematica…
723.663987159729
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10. H – H2 RD Model Parameters
783.54398822784424
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11. NBTI Degradation Components
838.28498935699463
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12. Device Details – Prediction …
927.8149881362915
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13. Prediction of UF-OTF NBTI Degr…
989.3049898147583
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14. Device Dependent Parameters
1028.514988899231
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15. Prediction of NBTI Components …
1195.2049913406372
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16. Prediction of NBTI Components …
1280.2949876785278
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17. H – H2 RD Model: Analytical …
1393.9349870681763
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18. Very Long Time Degradation
1476.3249864578247
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19. Simplified NBTI Degradation Mo…
1540.9049882888794
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20. Prediction of UF-OTF NBTI Degr…
1592.9849901199341
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21. Prediction of OTF NBTI Degrada…
1619.9549894332886
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22. Device Dependent Parameters (S…
1645.3659887313843
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23. Conventional OTF Measurement R…
1702.4759893417358
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24. NBTI Temperature Activation
1751.29598903656
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25. Voltage Acceleration & Project…
1865.1159887313843
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26. Projection: Long Time Degradat…
1995.7059850692749
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27. Prediction of UF-OTF NBTI Degr…
2051.2759847640991
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28. Device Dependent Parameters (H…
2092.9659833908081
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29. Summary – Model for NBTI DC …
2129.365984916687
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30. Outline
2250.4659833908081
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31. NBTI Experimental Signatures (…
2290.5569829940796
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32. NBTI Experimental Signatures (…
2352.3079824447632
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33. NBTI Recovery Model
2460.2179861068726
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34. Prediction of Recovery Transie…
2548.5679845809937
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35. Prediction of Recovery Transie…
2629.107985496521
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36. Modification of R-D Framework
2707.0279836654663
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37. Prediction of NBTI Recovery  
2850.9179830551147
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38. AC Degradation – Duty Cycle …
2938.2879858016968
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39. Renormalization of AC Degradat…
3070.8479833602905
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40. Prediction of Duty Cycle Depen…
3146.9679861068726
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41. Trap Generation – Duty Cycle…
3273.5179891586304
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42. NBTI Frequency (In)dependence
3358.2189855575562
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43. RD solution: NBTI Frequency In…
3512.1389837265015
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44. Summary – Model for NBTI Rec…
3568.1499853134155
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45. Outline
3689.5799856185913
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46. Conclusions
3697.4999856948853
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47. Outlook
3796.7199869155884
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