The MVS Nanotransistor Model: A Primer

By Mark Lundstrom

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

Published on

Abstract

The MIT virtual source (MVS) nanotransistor model provides a simple, physical description of transistors that operate in the quasi-ballistic regime. With only a few empirical parameters that are easily obtained through device characterization, the MVS model has served well for technology benchmarking and more recently it was extended to a full-fledged compact model and validated via circuit simulation and comparison with experimental data on both silicon and III-V transistors.

In this talk, I will present a gentle introduction to the MVS model. I’ll show how the basic equations of the model can be obtained by using a traditional approach to MOSFETs. I’ll then indicate how the parameters in this traditional model must be re-interpreted in order to capture the physics of nanoscale transistors. My goal is to set the stage for the seminar by Dr Shaloo Rakheja, which follows. Dr. Rakheja will discuss some of the issues involved in turning the physics-based analytical model for nanotransistors into a compact model suitable to use in SPICE-based circuit simulation.

 

Bio

Mark Lundstrom is the Don and Carol Scifres Distinguished Professor of Electrical and Computer Engineering at Purdue University where his teaching and research center on the physics, technology, and simulation of electronic devices. Lundstrom was the founding director of the NSF- funded Network for Computational Nanotechnology, which created the nanoHUB science gateway that now serves over 300,000 users per year. He currently leads an NSF-SRC initiative, NEEDS, that connects material and device technologists to circuit and system designers. He is a member of the U.S. National Academy of Engineering, a fellow of the IEEE, APS, and AAAS, and the recipient of several awards for his contributions to research and education.

Cite this work

Researchers should cite this work as follows:

  • Mark Lundstrom (2014), "The MVS Nanotransistor Model: A Primer," https://nanohub.org/resources/21703.

    BibTex | EndNote

Time

Location

Birck Nanotechnology Center, Rm 1001, Purdue University, West Lafayette, IN

Tags

The MVS Nanotransistor Model: A Primer
  • A Primer on the Virtual Source Model for Nanoscale MOSFETs Professor Mark Lundstrom Electrical and Computer Engineering Purdue University, West Lafayette, IN USA lundstro@purdue.edu 1. A Primer on the Virtual Source… 0
    00:00/00:00
  • the MIT VS Model 2. the MIT VS Model 112.67934601267935
    00:00/00:00
  • outline 3. outline 150.35035035035037
    00:00/00:00
  • MOSFET IV characteristic 4. MOSFET IV characteristic 192.55922589255923
    00:00/00:00
  • MOSFET IV: low VDS 5. MOSFET IV: low VDS 236.40306973640307
    00:00/00:00
  • High VDS : velocity saturation 6. High VDS : velocity saturation 331.63163163163165
    00:00/00:00
  • MOSFET IV: velocity saturation 7. MOSFET IV: velocity saturation 389.85652318985655
    00:00/00:00
  • MOSFET: IV (re-cap) 8. MOSFET: IV (re-cap) 426.99366032699368
    00:00/00:00
  • piecewise model for ID(VGS, VDS) 9. piecewise model for ID(VGS, VD… 471.37137137137137
    00:00/00:00
  • From low VDS to high VDS 10. From low VDS to high VDS 510.61061061061065
    00:00/00:00
  • saturating function: FSAT (VD) 11. saturating function: FSAT (VD) 638.20487153820488
    00:00/00:00
  • level 0 model 12. level 0 model 651.65165165165172
    00:00/00:00
  • output resistance 13. output resistance 741.27460794127467
    00:00/00:00
  • level 0' model 14. level 0' model 838.13813813813817
    00:00/00:00
  • outline 15. outline 870.83750417083752
    00:00/00:00
  • below threshold 16. below threshold 878.57857857857857
    00:00/00:00
  • subthreshold (surface potential) 17. subthreshold (surface potentia… 931.031031031031
    00:00/00:00
  • subthreshold (gate voltage) 18. subthreshold (gate voltage) 1077.8445111778447
    00:00/00:00
  • charge vs. gate voltage 19. charge vs. gate voltage 1223.2565899232566
    00:00/00:00
  • subthreshold characteristics 20. subthreshold characteristics 1254.4878211544879
    00:00/00:00
  • subthreshold (summary) 21. subthreshold (summary) 1268.4684684684685
    00:00/00:00
  • empirical treatment 22. empirical treatment 1311.8451785118452
    00:00/00:00
  • empirical treatment 23. empirical treatment 1388.0213546880214
    00:00/00:00
  • Level 1 model 24. Level 1 model 1416.1494828161494
    00:00/00:00
  • Appendix 2: MVS empirical charge model 25. Appendix 2: MVS empirical char… 1471.9719719719719
    00:00/00:00
  • intrinsic vs. extrinsic voltages 26. intrinsic vs. extrinsic voltag… 1567.4341007674341
    00:00/00:00
  • Level 1' model 27. Level 1' model 1617.5508842175509
    00:00/00:00
  • outline 28. outline 1647.9145812479146
    00:00/00:00
  • MOSFETs 29. MOSFETs 1710.4771438104772
    00:00/00:00
  • mobility 30. mobility 1765.4988321654989
    00:00/00:00
  • mobility 31. mobility 1837.5375375375377
    00:00/00:00
  • velocity saturation in bulk semiconductors 32. velocity saturation in bulk se… 1923.2232232232234
    00:00/00:00
  • 33. "velocity overshoot" 1952.0186853520188
    00:00/00:00
  • The MVS model 34. The MVS model 2103.9039039039039
    00:00/00:00
  • apparent mobility 35. apparent mobility 2199.8331664998332
    00:00/00:00
  • ballistic limit (low VDS) 36. ballistic limit (low VDS) 2375.1084417751085
    00:00/00:00
  • injection velocity 37. injection velocity 2414.7147147147148
    00:00/00:00
  • ballistic limit (high VDS) 38. ballistic limit (high VDS) 2588.3216549883218
    00:00/00:00
  • The VS nanotransistor model 39. The VS nanotransistor model 2637.7377377377379
    00:00/00:00
  • The MVS model 40. The MVS model 2664.1975308641977
    00:00/00:00
  • conclusions 41. conclusions 2704.1041041041044
    00:00/00:00