Courses

Negative Bias Temperature Instability (NBTI)

In this modular course, we will cover recent advances in Negative Bias Temperature Instability (NBTI), which is a crucial reliability issue for Silicon Oxynitride and High K Metal Gate PMOS devices. We will cover different aspects of NBTI in a total of 9 different presentations.

  1. devices
  2. high-k metal gates
  3. nanoelectronics
  4. NBTI
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