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SCALE Total Ionizing Dose Response Mechanisms in a 12-nm FinFET Technology
Online Presentations | 21 Feb 2024 | Contributor(s):: Hugh Barnaby
This talk was also presented at the 2024 Microelectronics Reliability and Qualification Workshop, The Aerospace Corporation, El Segundo, CA, February, 6, 2024.
Radiation Testing of Edge Processors for DAVINCI, A NASA Mission to Venus
Online Presentations | 09 Jan 2024
This lecture will discuss the NASA DAVINCI mission and the results from radiation testing of an emerging class of microprocessors (Tensor Processing Units (TPUs) and Vision Processing Units (VPU)) designed to enable edge computing and artificial intelligence (AI) applications, under...
Considerations for Radiation Effects in Heterogeneously Integrated and Packaged Microelectronics
Online Presentations | 08 Jan 2024 | Contributor(s):: Michael Alles
SCALE Random Telegraph Noise and Radiation Reponse of 80nm Vertical Charge-Trapping NAND Flash Memory Devices with SiON Tunneling Oxide
Online Presentations | 02 Jan 2024 | Contributor(s):: Isabella Wynocker
SCALE Mitigation of Radiation Effects in Microelectronics
Online Presentations | 15 Nov 2023 | Contributor(s):: Daniel Loveless