SCALE Total Ionizing Dose Response Mechanisms in a 12-nm FinFET Technology

By Hugh Barnaby

Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ

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Online Presentations

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Abstract

This talk was also presented at the 2024 Microelectronics Reliability and Qualification Workshop, The Aerospace Corporation, El Segundo, CA, February, 6, 2024.

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Tags

  1. CMOS
  2. FinFET
  3. radiation hardening
  4. radiation testing
  5. SCALE@ASU
  6. SCALE (Scalable Asymmetric Lifecycle Engagement)
  7. total ionizing dose