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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
Online Presentations | 24 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.
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Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 03: More KITE Setup and Features
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 06: Troubleshooting
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 07: KCON Utility Overview
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
Theory of Operation and Measurement Overview
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Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS: KITE Demo
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
Online Presentations | 20 Jan 2011 | Contributor(s):: Lee Stauffer
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Device Characterization with the Keithley 4200-SCS
Courses | 20 Jan 2011 | Contributor(s):: Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
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Atomistic Modeling and Simulation Tools for Nanoelectronics and their Deployment on nanoHUB.org
Online Presentations | 16 Dec 2010 | Contributor(s):: Gerhard Klimeck
At the nanometer scale the concepts of device and material meet and a new device is a new material and vice versa. While atomistic device representations are novel to device physicists, the semiconductor materials modeling community usually treats infinitely periodic structures. Two electronic...
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Chemically Enhanced Carbon-Based Nanomaterials and Devices
Online Presentations | 09 Nov 2010 | Contributor(s):: Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...
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Nanoelectronic Devices, With an Introduction to Spintronics
Courses | 09 Sep 2010 | Contributor(s):: Supriyo Datta, Mark Lundstrom
Nanoelectronic devices are at the heart of today's powerful computers and are also of great interest for many emerging applications including energy conversion, sensing and alternative computing paradigms. Our objective, however, is not to discuss specific devices or...
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Discussion Session 2 (Lectures 3 and 4)
Online Presentations | 08 Sep 2010 | Contributor(s):: Supriyo Datta
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Lecture 3: Introduction to NEGF
Online Presentations | 08 Sep 2010 | Contributor(s):: Supriyo Datta
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Nanoelectronic Modeling Lecture 40: Performance Limitations of Graphene Nanoribbon Tunneling FETS due to Line Edge Roughness
Online Presentations | 05 Aug 2010 | Contributor(s):: Gerhard Klimeck, Mathieu Luisier
This presentation the effects of line edge roughness on graphene nano ribbon (GNR) transitors..Learning Objectives:GNR TFET Simulation pz Tight-Binding Orbital Model 3D Schrödinger-Poisson Solver Device Simulation Structure Optimization (Doping, Lg, VDD) LER => Localized Band Gap States LER =>...