• Introduction to Device Characterization
• System Overview: System Architecture, Hardware Features and Software Features
• Precision DC I-V Source-Measure Features and Concepts

Researchers should cite this work as follows:

• Lee Stauffer (2011), "Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement," https://nanohub.org/resources/10387.

  BibTex | EndNote

1. CV curves
2. Device Characterization
3. devices
4. experiments
5. I-V curves/characteristics
6. Keithley 4200-SCS
7. nanoelectronics