NCN Nanoelectronics: Simulation Tools for Research
- This resource has a 5.1 Ranking
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Usage Stats Last 12 Months: updated 01 Jul, 2008 Users: 0 Reviews & Citations Google/IEEE Avg. Review: Citations: 0
| Contributor(s) | |
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| Abstract | Many simulation tools are available on the nanoHUB. The tools have been well-tested and here include supporting materials so that they can be effectively used for education or intelligently used for research. The research tools include a first time users guide and supporting publications and theses.
Click here for a list of recommended simulation tools for education. |
| Cite this work | If you reference this work in a publication, please cite as follows: |
| Date posted | 28 Nov, 2007 |
| Type | Series |
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In This Series
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Bandstructure Lab
- This resource has a 10.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 1771 Jobs: 12091 Avg. exec. time: 8 mins Reviews & Citations Google/IEEE: updated 15 Apr, 2008 Avg. Review: Citations: 7
1771 users, detailed statistics
19 May. 2006 | Tools | Contributor(s): Mathieu Luisier, Raseong Kim, Neophytos Neophytou, Michael McLennan, Jing Wang, Anisur Rahman, Gerhard Klimeck, Mark Lundstrom
Simulate electronic band structure for a variety of bulk materials and device geometries such as quantum wells and nanowires.
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Schred
- This resource has a 9.7 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 1294 Jobs: 31005 Avg. exec. time: 52 secs Reviews & Citations Google/IEEE: updated 13 Jun, 2008 Avg. Review: Citations: 80
1294 users, detailed statistics
09 Feb. 2006 | Tools | Contributor(s): Dragica Vasileska, Shaikh S. Ahmed, Matteo Mannino, Akira Matsudaira, Gerhard Klimeck, Mark Lundstrom
Calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS (Metal-Oxide-Semiconductor) or SOS (Semiconductor-Oxide- Semiconductor) structure and a typical SOI structure
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CNTbands 2.0
- This resource has a 9.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 1875 Jobs: 17809 Avg. exec. time: 27 secs Reviews & Citations Google/IEEE: updated 28 Apr, 2008 Avg. Review: Citations: 10
1875 users, detailed statistics
14 Dec. 2006 | Tools | Contributor(s): Youngki Yoon, Diego Kienle, James K Fodor, Gengchiau Liang, Akira Matsudaira, Gerhard Klimeck, Jing Guo
CNTbands v2.0 can simulate electronic band structure and density-of-states for carbon nanotubes (CNTs) and carbon nanoribbons (CNRs). It also computes some basic parameters, such as nanotube diameter, number of hexagons in the unit cell, band gap, etc. Users may select the CNR structure to be …
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PETE: Purdue Exploratory Technology Evaluator
- This resource has a 8.6 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 108 Jobs: 3306 Avg. exec. time: 3 mins Reviews & Citations Google/IEEE Avg. Review: Citations: 0
108 users, detailed statistics
27 Jun. 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy
Using PETE one can evaluate any MOSFET like devices or any New Devices in terms of performance on Benchmark circuits. The input to the tool can be in terms of typical MOSFET parameters or in terms of I-V and C-V tables. The Benchmark circuits include minim
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nanoMOS
- This resource has a 7.2 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 1074 Jobs: 10272 Avg. exec. time: 16 mins Reviews & Citations Google/IEEE: updated 03 Jun, 2008 Avg. Review: Citations: 51
1074 users, detailed statistics
19 May. 2006 | Tools | Contributor(s): Zhibin Ren, Sebastien Goasguen, Akira Matsudaira, Shaikh S. Ahmed, Kurtis Cantley, Mark Lundstrom
2-D simulator for thin body (less than 5 nm), fully depleted, double-gated n-MOSFETs
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Device Reliability Tool
- This resource has a 6.0 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 181 Jobs: 746 Avg. exec. time: 58 secs Reviews & Citations Google/IEEE: updated 05 Feb, 2008 Avg. Review: Citations: 1
181 users, detailed statistics
28 Aug. 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam
Analyzes MOS device reliability based on Negative Bias Temperature Instability (NBTI).
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NanoNET
- This resource has a 5.2 Ranking
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Ranking is calculated from a formula comprised of user reviews and usage statistics. Learn more ›
Usage Stats Overall Period: Updated 19 Jul, 2008 Users: 316 Jobs: 1599 Avg. exec. time: 12 mins Reviews & Citations Google/IEEE: updated 22 Apr, 2008 Avg. Review: Citations: 3
316 users, detailed statistics
17 Jan. 2007 | Tools | Contributor(s): Ninad Pimparkar, Satish Kumar, Jayathi Murthy, Muhammad A. Alam
NanoNET is a tool to simulate the Nanobundle Network Thin Film Transistors (NB-TFTs). Random networks of carbon nanotubes with thousands of tubes and random orientation can be simulated using this tool. The final answer can be compactly formulated in the formula shown in the picture. Here ID is …
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- 0.0 Ranking Topic NCN Nanoelectronics
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