In This Series

1. Schred

   4.5 out of 5 stars 

   Tools | 30 Mar 2006 | Contributor(s): Dragica Vasileska, Shaikh S. Ahmed, Gokula Kannan, Matteo Mannino, Gerhard Klimeck, Mark Lundstrom, Akira Matsudaira, Junzhe Geng

   SCHRED simulation software calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS, SOS and a typical SOI structure.

2. Band Structure Lab

   5.0 out of 5 stars 

   Tools | 19 May 2006 | Contributor(s): Samik Mukherjee, Kai Miao, Abhijeet Paul, Neophytos Neophytou, Raseong Kim, Junzhe Geng, Michael Povolotskyi, Tillmann Christoph Kubis, Arvind Ajoy, Bozidar Novakovic, James Fonseca, Hesameddin Ilatikhameneh, Sebastian Steiger, Michael McLennan, Mark Lundstrom, Gerhard Klimeck

   Computes the electronic and phonon structure of various materials in the spatial configuration of bulk , quantum wells, and wires

3. NanoMOS

   3.5 out of 5 stars 

   Tools | 19 May 2006 | Contributor(s): , Sebastien Goasguen, Akira Matsudaira, Shaikh S. Ahmed, Kurtis Cantley, Yang Liu, Yunfei Gao, Xufeng Wang, Mark Lundstrom

   2-D simulator for thin body (less than 5 nm), fully depleted, double-gated n-MOSFETs

4. Modeling Interface-defect Generation (MIG)

   4.0 out of 5 stars 

   Tools | 18 Jul 2006 | Contributor(s): Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam

   Analyzes device reliability based on NBTI

5. CNTbands

   4.5 out of 5 stars 

   Tools | 14 Dec 2006 | Contributor(s): Gyungseon Seol, Youngki Yoon, James K Fodor, Jing Guo, Akira Matsudaira, Diego Kienle, Gengchiau Liang, Gerhard Klimeck, Mark Lundstrom, Ahmed Ibrahim Saeed

   This tool simulates E-k and DOS of CNTs and graphene nanoribbons.

6. NanoNet

   2.0 out of 5 stars 

   Tools | 17 Jan 2007 | Contributor(s): Satish Kumar, Man Prakash Gupta, Ninad Pimparkar, Jayathi Murthy, Muhammad Alam

   A simulation tool for Thin films transistors based on network of nanotubes or nanowires

7. PETE : Purdue Emerging Technology Evaluator

   5.0 out of 5 stars 

   Tools | 26 Jun 2007 | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy

   Estimate circuit level performance and power of novel devices