Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode
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Abstract
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. Topics will include:
- Introduction to resonant AFM modes and a survey of their applications.
- Quantitative nano-mechanical measure- ments and nano-manipulation, including HybriD mode.
Outline:
- Part I – Introduction and “Getting in Contact”
- AFM operational principles
- 3 main ways AFM interacts with the surface
- Contact mode related AFM techniques
- Part II – Resonance Oscillatory Modes
- Approach of resonant interaction
- Tapping Mode – a “good child”
- Tips for getting a perfect image in Tapping
- Tapping-related AFM techniques
- Tracking the frequency
- Part III – Non-Resonant Oscillatory HybriD Mode
- Tracking the topography
- QNM – Quantitative Mechanical Mapping
- HybriD Mod related AFM techniques
- Few words about Optics
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Room 1001, Birck Nanotehnology Center, Purdue. University, West Lafayette, IN