Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes
Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes
-
1. Workshop on Nanomaterials Char…
0
00:00/00:00
-
2. Resonant AFM
12.579245912579246
00:00/00:00
-
3. Tapping (Semicontact, Non-cont…
132.0653987320654
00:00/00:00
-
4. Amplitude Modulation Mode Exam…
236.67000333667002
00:00/00:00
-
5. High-Resolution Imaging in AM-…
316.71671671671675
00:00/00:00
-
6. Phase Imaging
383.08308308308312
00:00/00:00
-
7. Phase Imaging. Scan Examples.
502.93626960293631
00:00/00:00
-
8. Amplitude Modulation with Freq…
549.98331664998329
00:00/00:00
-
9. Frequency Modulation Mode
671.07107107107106
00:00/00:00
-
10. Amplitude Modulation Mode Exam…
762.26226226226231
00:00/00:00
-
11. AFM vs. Astronomy
777.344010677344
00:00/00:00
-
12. Easy Way of Getting a Good Ima…
949.88321654988329
00:00/00:00
-
13. Simple Harmonic Oscillator
1018.3850517183851
00:00/00:00
-
14. Attraction Regime
1099.8665331998666
00:00/00:00
-
15. Repulsion Regime
1175.4087420754088
00:00/00:00
-
16. Switching Between the Regimes
1243.2766099432768
00:00/00:00
-
17. Examination of Local Electrost…
1808.4751418084752
00:00/00:00
-
18. Examination of Local Electric …
1847.3473473473475
00:00/00:00
-
19. Examination of Local Electric …
1926.6933600266934
00:00/00:00
-
20. Magnetic Force Microscopy (MFM…
2087.9546212879545
00:00/00:00
-
21. MFM Principle
2112.345679012346
00:00/00:00
-
22. Temperature Dependency
2191.1911911911911
00:00/00:00
-
23. Domain Structure Transformatio…
2273.0397063730397
00:00/00:00