Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode
Online Presentations | 11 Nov 2018 | Contributor(s): Stanislav Leesment
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.
Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.
Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”
NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.
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