You must login before you can run this tool.
Cylindrical CNT MOSFET Simulator
Simulate 2-D electrons transport in CNTFET
Version 0.9.6 - published on 15 Aug 2014
doi:10.4231/D39C6S20D cite this
This tool is closed source.
Citations Non-affiliated (4) | Affiliated (3)
Non-affiliated authors
- Abhinav Sharma, Adarsh Kumar, Suresh Sharma, (2022), "Effect Of Process Parameters On CNTFET", Advances in Manufacturing Technology and Management, Advances in Manufacturing Technology and Management, Springer: pg: 398-403
- Mohammad Pivezhandi, Kambiz Abedi, Alireza Hassanzadeh, (2017), "Accuracy Improvement With Reliable Statistical-based Models For CNT-FET Applications", J Comput Electron, 16: pg: 610-619, (DOI: 10.1007/s10825-017-1026-3)
- Vishesh Dokania, Aminul Islam, Vivek Dixit, Shree Tiwari, (2016), "Analytical Modeling Of Wrap-Gate Carbon Nanotube FET With Parasitic Capacitances And Density Of States", IEE Transactions on Electron Devices, : pg: 1-6, 0018-9383, (DOI: 10.1109/TED.2016.2581119)
- S. Yamacli, M. Avci, (2012), "Accurate SPICE Compatible CNT Interconnect And CNTFET Models For Circuit Design And Simulation", Mathematical And Computer Modelling, Elsevier, 58, 1: pg: 1-18, (DOI: doi:10.1016/j.mcm.2012.11.014)
Affiliated authors
- Chi-Shuen Lee, Eric Pop, Aaron Franklin, Wilfried Haensch, H.-S.P. Wong, (2015), "A Compact Virtual-Source Model For Carbon Nanotube Field-Effect Transistors In The Sub-10-nm Regime-Part II Extrinsic Elements, Performance Assessment, And Design Optimization", : pg: -
- Chi-Shuen Lee, Eric Pop, Aaron Franklin, H.-S. Wong, Wilfried Haensch, (2015), "A Compact Virtual-Source Model For Carbon Nanotube Field-Effect Transistors In The Sub-10-nm Regime-Part I Intrinsic Elements", : pg: -
- Gage Hills, Jie Zhang, Max Shulaker, Hai Wei, C-S Lee, Arjun Balasingam, H-S Wong, Subhasish Mitra, (2015), "Rapid Co-optimization Of Processing And Circuit Design To Overcome Carbon Nanotube Variations", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 34, 7: pg: 1082-1095, 0278-0070, (DOI: 10.1109/TCAD.2015.2415492)