ECE 606 L20.4: PN Diode - Non-Ideal Effects

By Gerhard Klimeck

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Gerhard Klimeck (2023), "ECE 606 L20.4: PN Diode - Non-Ideal Effects," https://nanohub.org/resources/37158.

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Tags

  1. diodes
  2. ECE606-Klimeck
  3. impact ionization
  4. I-V curves/characteristics
  5. pn diodes
  6. recombination
  7. reverse bias
  8. Zener tunneling
ECE 606 L20.4: Non-Ideal Effects
  • Section 20.4 Non-Ideal Effects 1. Section 20.4 Non-Ideal Effects 0
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  • Section 20 PN Diode I-V Characteristics 2. Section 20 PN Diode I-V Charac… 21.35468802135469
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  • (4,6) Junction Recombination 3. (4,6) Junction Recombination 24.824824824824827
    00:00/00:00
  • (4,6) Junction Recombination 4. (4,6) Junction Recombination 74.207540874207538
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  • Electron/Hole Concentrations at Junction 5. Electron/Hole Concentrations a… 244.21087754421089
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  • Junction Recombination 6. Junction Recombination 395.69569569569569
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  • Junction Recombination in Forward Bias 7. Junction Recombination in Forw… 509.0423757090424
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  • Junction Leakage in Practice 8. Junction Leakage in Practice 631.73173173173177
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  • Junction Recombination in Reverse Bias 9. Junction Recombination in Reve… 702.46913580246917
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  • Junction Recombination in Reverse Bias 10. Junction Recombination in Reve… 778.07807807807808
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  • Section 20 PN Diode I-V Characteristics 11. Section 20 PN Diode I-V Charac… 852.28561895228563
    00:00/00:00
  • Section 20 PN Diode I-V Characteristics 12. Section 20 PN Diode I-V Charac… 856.72339005672347
    00:00/00:00
  • Forward Bias Nonlinearity (7): Esaki Diode 13. Forward Bias Nonlinearity (7):… 860.16016016016022
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  • Reverse Bias (5): Zener Tunneling 14. Reverse Bias (5): Zener Tunnel… 1042.4424424424424
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  • Various Regions of I-V Characteristics 15. Various Regions of I-V Charact… 1133.4668001334669
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  • Section 20 PN Diode I-V Characteristics 16. Section 20 PN Diode I-V Charac… 1141.5415415415416
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  • Avalanche Breakdown 17. Avalanche Breakdown 1223.8238238238239
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  • Nonlinearity due to Impact-Ionization 18. Nonlinearity due to Impact-Ion… 1231.1311311311313
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  • Nonlinearity due to Impact-Ionization 19. Nonlinearity due to Impact-Ion… 1255.7891224557891
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  • Impact-ionization and Flux Conservation 20. Impact-ionization and Flux Con… 1380.5805805805805
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  • Impact-ionization and Flux Conservation 21. Impact-ionization and Flux Con… 1492.0920920920921
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  • Impact-ionization 22. Impact-ionization 1564.5645645645645
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  • Impact-ionization 23. Impact-ionization 1704.170837504171
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  • Impact-ionization: In Practice 24. Impact-ionization: In Practice 1822.6226226226227
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  • Junction Engineering 25. Junction Engineering 1883.9506172839506
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  • Modern Considerations: Dead Space 26. Modern Considerations: Dead Sp… 1972.2722722722724
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  • Zener Breakdown vs. Impact Ionization 27. Zener Breakdown vs. Impact Ion… 2029.4294294294295
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  • Non-Ideal Effects: Conclusion 28. Non-Ideal Effects: Conclusion 2133.3667000333667
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  • Section 20 PN Diode I-V Characteristics 29. Section 20 PN Diode I-V Charac… 2188.5552218885555
    00:00/00:00
  • Section 20 PN Diode I-V Characteristics 30. Section 20 PN Diode I-V Charac… 2192.1254587921258
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