Robert Passeri, Hitachi engineer, discusses STEM and low kV imaging techniques with the Hitachi SEM S4800.

Birck Nanotechnology Center

Researchers should cite this work as follows:

• (2022), "Alternative Hitachi SEM Techniques," https://nanohub.org/resources/36093.

  BibTex | EndNote

1. carbon nanotubes
2. field emission SEM (FESEM)
3. Hitachi S-4800
4. nanowires
5. scanning electron microscopy (SEM)
6. semiconductors