Electronics From the Bottom Up: top-down/bottom-up views of length
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Abstract
When devices get small stochastic effects become important. Random
dopant effects lead to uncertainties in a MOSFET’s threshold voltage
and gate oxides breakdown is a random process. Even a concept as
simple as “channel length” becomes uncertain. This short (20 min)
talk, a footnote to the presentation, “An Introduction to Electronics
from the Bottom Up,” shows that these two seemingly unrelated
problems are part of a more general problem involving percolative
transport at the nanoscale.
For a complete list of resources related to this project please see: Electronics from the Bottom Up.
For a complete list of resources related to this project please see: Electronics from the Bottom Up.
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