Ahmad Ehteshamul Islam
Usage
Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.
Item | Value |
---|---|
Contributions: | 6 |
Rank by Contributions: | 276 / 2839 |
First Contribution: | 28 Aug 2006 |
Last Contribution: | 30 Sep 2011 |
Citations on Contributions: | 5 |
Usage in Courses/Classrooms: | 63 users served in 8 courses from 4 institutions |
# | Tool Name | Users served in last 12 months | Simulation Runs in last 12 months | Total users served | Total Simulation Runs | Citations | Published On |
---|---|---|---|---|---|---|---|
1 | Modeling Interface-defect Generation (MIG) | 21 | 58 | 739 | 8,983 | 3 | 27 Aug 2006 |
Total | 21 | 58 | 596 | 8,983 |
# | Resource Title | Users served in last 12 months | Total users served | Citations | Published On |
---|---|---|---|---|---|
1 | Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Papers | 39 | 1,313 | - | 29 Sep 2011 |
2 | Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations | 12 | 1,262 | 2 | 01 May 2011 |
3 | Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations | 22 | 388 | - | 30 Dec 2009 |
4 | On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations | 23 | 674 | - | 29 Dec 2009 |
5 | Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations | 4 | 241 | - | 30 Jun 2008 |
TOTAL | 100 | 3,878 | 2 |
* Total only includes versions of the tools this author contributed to.