Sang Hoon Shin
Usage
Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.
Item | Value |
---|---|
Contributions: | 2 |
Rank by Contributions: | 751 / 2861 |
First Contribution: | 20 Jan 2015 |
Last Contribution: | 11 Jan 2016 |
Citations on Contributions: | - |
# | Tool Name | Users served in last 12 months | Simulation Runs in last 12 months | Total users served | Total Simulation Runs | Citations | Published On |
---|---|---|---|---|---|---|---|
1 | Time-dependent gate oxide breakdown Lab | 1 | 2 | 7 | 41 | - | 19 Jan 2015 |
Total | 1 | 2 | 7 | 41 |
# | Resource Title | Users served in last 12 months | Total users served | Citations | Published On |
---|---|---|---|---|---|
1 | Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET Presentation Materials | 43 | 349 | - | 10 Jan 2016 |
TOTAL | 43 | 349 | 0 |
* Total only includes versions of the tools this author contributed to.