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1. Novel EM Nanoscale Techniques

   Presentation Materials | 27 Nov 2017 | Contributor(s):: Brian Demczyk

   Describes unconventional use of conventional techniques (SAD,CBED, HREM and Fourier analysis) to elucidate hard-to-access structural information at the nano scale.

2. Structure and Morphology of Silicon-Germanium Thin Films

   Presentation Materials | 07 Feb 2015 | Contributor(s):: Brian Demczyk

   This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...

3. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

   Presentation Materials | 25 Mar 2014 | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

   The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...

4. Surface structure and composition of high-surface-area molybdenum nitrides

   Papers | 02 Feb 2012 | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson

   In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.

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   naitbouda abdelyamine

   process engineer in plasma etch processHead of characterization département of CDTA use molecular dynamics simulation for exploring nanotechnology world

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