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3 min Research Talk: AFM And EBSD Cross-Comparison Analysis Tool
Online Presentations | 31 Jan 2019 | Contributor(s):: Andrew Martin Krawec
This talk describes an approach to analyzing the crystal structure using data collected from AFM and EBSD scans to build an accurate image of the crystal structure and orientation in the ceramic
AFM And EBSD Cross-Comparison Analysis Tool
Presentation Materials | 14 Aug 2018 | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie
Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...