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Fabrication and Characterization of Nanostructures Using AFM
Online Presentations | 26 Feb 2022 | Contributor(s):: Wesley C. Sanders, Glen Johnson, NACK Network
The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic...