Charged-Particle Interaction Analysis
Online Presentations | 07 Jan 2022 | Contributor(s):: Atilla Ozgur Cakmak, NACK Network
Scanning Electron Microscopy (SEM) has traditionally been the most frequently used micro-/nano- characterization technique to overcome the optical losses coming from lenses. In this talk we are going to begin by discussing the fundamental blocks of an SEM starting from the electron beam emission....