Tags: atomic force microscopy (AFM)

More tags

Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Presentation Materials (1-7 of 7)

  1. AFM And EBSD Cross-Comparison Analysis Tool

    Presentation Materials | 14 Aug 2018 | Contributor(s):: Andrew Martin Krawec, John Blendell, Matthew John Michie

    Ceramic and semiconductor research is limited in its ability to create holistic representations of data in concise, easily-accessible file formats or visual data representations. These materials are used in everyday electronics, and optimizing their electrical and physical properties is...

  2. Structure and Morphology of Silicon-Germanium Thin Films

    Presentation Materials | 07 Feb 2015 | Contributor(s):: Brian Demczyk

    This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...

  3. Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films

    Presentation Materials | 25 Mar 2014 | Contributor(s):: Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik

    The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...

  4. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    Presentation Materials | 15 Jul 2013 | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

  5. On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

    Presentation Materials | 26 Oct 2012 | Contributor(s):: Brian Demczyk

    This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...

  6. Images for AFM

    Presentation Materials | 17 Feb 2009 | Contributor(s):: yan zhang

  7. Determining the Mechanics of Living Cells by Atomic Force Microscopy

    0.0 out of 5 stars 

    Presentation Materials | 21 Apr 2004 | Contributor(s):: Emilie Grzywa Rexeisen

    2003 SURI Conference Proceedings