Texture-Induced hcp c-axis Alignment in Longitudinal Media

By Brian Demczyk

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Abstract

This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.

Credits

Hard disk media were produced and atomic force microscopy performed at the Maxtor Corporation San Jose, CA facility (now closed). High-resolution transmission electron microscopy was undertaken at the National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA.

Cite this work

Researchers should cite this work as follows:

  • Brian Demczyk (2013), "Texture-Induced hcp c-axis Alignment in Longitudinal Media," https://nanohub.org/resources/18917.

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Tags

  1. atomic force microscopy (AFM)
  2. magnetic thin films
  3. orientation ratio
  4. surface roughness scattering
  5. texture
  6. transmission electron microscopy (TEM)