Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

Online Presentations (41-60 of 105)

  1. ME 597 Lecture 21: Frequency Modulated AFM

    Online Presentations | 22 Nov 2010 | Contributor(s):: Ron Reifenberger

  2. ME 597 Lecture 18b: Analytical Approaches - Peak Interaction Forces

    Online Presentations | 17 Nov 2010 | Contributor(s):: Arvind Raman

    Peak Force During Tapping - not directly observable.

  3. ME 597 Lecture 18a: Analytical Approaches

    Online Presentations | 17 Nov 2010 | Contributor(s):: Arvind Raman

  4. ME 597 Lecture 19: VEDA - Scanning Controls

    Online Presentations | 11 Nov 2010 | Contributor(s):: Arvind Raman

  5. ME 597 Lecture 15: Dynamic Approach Curves

    Online Presentations | 09 Nov 2010 | Contributor(s):: Arvind Raman

  6. ME 597 Lecture 14: Introduction to Dynamic AFM

    Online Presentations | 04 Nov 2010 | Contributor(s):: Arvind Raman

  7. ME 597 Lecture 13: Virtual Environment for Dynamic AFM (VEDA)

    Online Presentations | 04 Nov 2010 | Contributor(s):: John Melcher

    Guest lecturer: John Melcher. VEDA Demonstration; Overview of Capabilities; F-Z Curve Tool

  8. ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves

    Online Presentations | 29 Oct 2010 | Contributor(s):: Ryan Wagner, Arvind Raman

    Guest lecturer: Ryan Wagner.

  9. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    Online Presentations | 20 Oct 2010 | Contributor(s):: Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....

  10. ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

    Online Presentations | 20 Oct 2010 | Contributor(s):: Arvind Raman

    The raw recording for this lecture is all that is available.

  11. Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction

    Online Presentations | 12 Oct 2010 | Contributor(s):: Ashlie Martini

    This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on the...

  12. ME 597 Lecture 11: Three Important Callibrations

    Online Presentations | 11 Oct 2010 | Contributor(s):: Arvind Raman

  13. ME 597 Lecture 10: Force Distance Curves II

    Online Presentations | 11 Oct 2010 | Contributor(s):: Arvind Raman

  14. ME 597 Lecture 7: Interaction Forces III

    Online Presentations | 05 Oct 2010

  15. ME 597 Lecture 8: Introduction to Contact Mechanics

    Online Presentations | 05 Oct 2010 | Contributor(s):: Ron Reifenberger

  16. ME 597 Lecture 9: Force Distance Curves I

    Online Presentations | 20 Sep 2010 | Contributor(s):: Arvind Raman

  17. ME 597 Lecture 6: Interaction Forces II

    Online Presentations | 16 Sep 2010

  18. ME 597 Lecture 5: Interaction Forces I

    Online Presentations | 14 Sep 2010 | Contributor(s):: Ron Reifenberger

    See reading references below.

  19. ME 597 Lecture 4: The Transition from STM to AFM

    Online Presentations | 09 Sep 2010 | Contributor(s):: Ron Reifenberger

    Recommended Reading: See References below.

  20. ME 597 Course Overview

    Online Presentations | 01 Sep 2010 | Contributor(s):: Ron Reifenberger