ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning

By Arvind Raman

Mechanical Engineering, Purdue University, West Lafayette, IN

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Online Presentations

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Abstract

The raw recording for this lecture is all that is available.

Cite this work

Researchers should cite this work as follows:

  • Arvind Raman (2010), "ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning," https://nanohub.org/resources/7983.

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Time

Location

Armstrong B71, Purdue University, West Lafayette

Tags

  1. Amplitude Modulation AFM
  2. atomic force microscopy (AFM)
  3. course lecture
  4. experiments
  5. materials science