XPS Thickness Solver

By Kyle Christopher Smith¹; David A Saenz¹; Dmitry Zemlyanov¹; Andrey A Voevodin²

1. Purdue University 2. Air Force Research Laboratory

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

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Version 3.11 - published on 15 Sep 2014

doi:10.4231/D3FJ29D7X cite this

This tool is closed source.

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Versions

Version	Released	DOI Handle	Published
3.11	15 Sep 2014	doi:10.4231/D3FJ29D7X	yes
3.0	04 Jun 2012	doi:10.4231/D3N29P603	no
beta 2.0	10 Jan 2012	doi:10.4231/D35D8ND60	no