PN Junction Lab (New Interactive Front End)

By Daniel Mejia1; Gerhard Klimeck1

1. Purdue University

Visualize and explore P-N junction concepts fully interactively: Band Edge Diagrams, Charge Densities, I-V and C-V Characteristics

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Version 0.3.1 - published on 17 Oct 2023

doi:10.21981/AXMV-PK90 cite this

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Newer version available

Newer version available

This resource has a newer version available at https://nanohub.org/resources/36260

    Conduction and valence band edge in equilibrium Conduction and valence band edge under bias - Quasi-Fermi levels split SCREENSHOT #3 Current voltage characteristics compared for light doping and heavy doping junctions Capacitance voltage characteristics compared for light doping and heavy doping junctions Conduction and valence band edge in equilibrium compared for light doping and heavy doping junctions SCREENSHOT #7 Electric fields compared for low and high doping profiles Excess charge densities compared for low and high doping profiles

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Abstract

PN Junction Lab - is a fully interactive app that enables the visualization and exploration of P-N junctions.   Users immediately see the conduction and valence band diagrams as well as the quasi-Fermi levels as the app starts up.  A slider at the bottom enables users to pan through various bias points and visualize the band-edge diagram as a function bias.   Other critical quantities such as charge densities, electric fields, current densities as well as full current-voltage and capacitance-voltage characteristics can be explored interactively with a click of a button.   

New simulations can be launched to explore different doping concentrations and temperatures.  Different materials such as Si, Ge, GaAs, and InP are available for exploration.    

Different PN-junction geometries such as short p or n regions which bring the surface recombination closer to the junction.   Advanced users can explore the effects different minority carrier lifetimes. 

The simulations are performed with a full industrial strength device simulation tool.   Numerical issues such as number of numerical nodes included in the simulation (i.e. meshing) can also be explored.

This new PN Junction Lab is powered by the previous Rappture-Based PN-Junction Lab but provides a much more interactive user experience.   The industrial strength PADRE tool developed at Bell Labs ultimately powers the simulations. 

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Researchers should cite this work as follows:

  • Daniel Mejia, Gerhard Klimeck (2023), "PN Junction Lab (New Interactive Front End)," https://nanohub.org/resources/pnjunctionlab. (DOI: 10.21981/AXMV-PK90).

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