Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale

By Nick Fang1; Omar N Sobh2

1. Massachusetts Institute of Technology (MIT) 2. University of Illinois at Urbana-Champaign

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Abstract

Sensing and Actuation in Nanoscale

Topics:

  • Scanning Tunneling Microscopy
  • Two Modes of Forming STM Images
  • STM Manipulation
  • Atomic Force Microscopy
  • Typical Engaging Curve
  • Imaging in Fluid
  • Shear Force Sensing by Tuning Fork
  • Tip Shape Effects: Containment
  • Tip Shape Effect: Cone Angle
  • Other Imaging Modes with AFM
  • Force Spectroscopy with AFM
  • Force Comparison
  • Molecular Recognition Imaging
  • Mechanical Sensing of Molecules
  • Principle of Cantilever Based Sensing
  • Example: PSA Detection
  • AFM Nanomanipulation

    • Cite this work

    Researchers should cite this work as follows:

    • Nick Fang, Omar N Sobh (2009), "Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale," https://nanohub.org/resources/8028.

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    Tags

    1. atomic force microscopy (AFM)
    2. course lecture
    3. Illinois
    4. nanophotonics
    5. nick fang
    6. sensors/sensing