Illinois ME 498 Introduction of Nano Science and Technology, Lecture 19: In Touch With Atoms
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Abstract
In touch with Atoms
Topics:
- Imaging With Energy Beams
- Energy Beam - Material Interactions
- Imaging Modes
- Addition Imaging Features
- Examples of FIB Technology
- Three Modes of FIB
- Radiation Damage of FIB
- Impact of GA Doping
- The Scanning Probe System
- Scanning Tunneling Microscopy
- STM Components
- Tunneling Current
- Two Modes of Forming STM Images
- Nanofabrication by STM
- Tunable Bond Formation by STM
- STM Manipulation
- Scanning Probe System
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