MSE 582 Lecture 4: The Instrument, Part 1

By Eric Stach

Materials Engineering, Purdue University, West Lafayette, IN

View Presentation

Additional materials available (6)

Licensed under General Performance Usage.

Category

Online Presentations

Published on

Cite this work

Researchers should cite this work as follows:

  • Eric Stach (2008), "MSE 582 Lecture 4: The Instrument, Part 1," https://nanohub.org/resources/3907.

    BibTex | EndNote

Time

Location

Armstrong 3115, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. electron microscopy
  3. transmission electron microscopy (TEM)
MSE 582 Lecture 4: The Instrument, Part 1
  • Lecture 4: 1. Lecture 4: "The instrument" I 0
    00:00/00:00
  • Review of imaging modes 2. Review of imaging modes 40.14014014014014
    00:00/00:00
  • TEM overview 3. TEM overview 113.94728061394729
    00:00/00:00
  • TEM cross section 4. TEM cross section 216.68335001668336
    00:00/00:00
  • TEM cross section (simplified - somewhat) 5. TEM cross section (simplified … 326.8601935268602
    00:00/00:00
  • TEM cross section 6. TEM cross section 359.15915915915917
    00:00/00:00
  • Condenser system 7. Condenser system 726.69336002669343
    00:00/00:00
  • Condenser system 8. Condenser system "parallel bea… 895.42876209542885
    00:00/00:00
  • Condenser system effect of C1 strength - 9. Condenser system effect of C1 … 1243.0430430430431
    00:00/00:00
  • Condenser system effect of C1 strength - 10. Condenser system effect of C1 … 1274.240907574241
    00:00/00:00
  • Condenser system parallel illumination (Köhler) 11. Condenser system parallel illu… 1367.3673673673675
    00:00/00:00
  • Condenser system aperture effect 12. Condenser system aperture effe… 1437.303970637304
    00:00/00:00
  • Condenser system focused probe 13. Condenser system focused probe 1493.8605271938607
    00:00/00:00
  • Condenser system 'convergent beam' focused probe 14. Condenser system 'convergent b… 1521.2212212212212
    00:00/00:00
  • Condenser system scanning / tilting & translating 15. Condenser system scanning / ti… 1681.7484150817486
    00:00/00:00
  • Condenser system 16. Condenser system 1780.4471137804471
    00:00/00:00
  • Objective & Imaging system 17. Objective & Imaging system 1841.8752085418753
    00:00/00:00
  • Eucentric position 18. Eucentric position 1893.626960293627
    00:00/00:00
  • Recall … 19. Recall … 2013.8805472138806
    00:00/00:00
  • TEM imaging 20. TEM imaging 2566.1995328661997
    00:00/00:00
  • TEM imaging 21. TEM imaging 2594.5945945945946
    00:00/00:00
  • TEM diffraction 22. TEM diffraction 2617.2172172172172
    00:00/00:00
  • TEM diffraction 23. TEM diffraction 2623.4234234234236
    00:00/00:00
  • Selected area diffraction aperture 24. Selected area diffraction aper… 2676.0093426760095
    00:00/00:00
  • Bright field image 25. Bright field image 2681.8485151818486
    00:00/00:00
  • 26. "Dirty" dark field 2709.80980980981
    00:00/00:00
Pop Out