Dr. David Daughton is a Lake Shore Application Scientist focused on characterizing electronic materials and devices. He received his BS and MS in Physics from the University of Delaware and his PhD in Physics from The Ohio State University in 2010. Much of his work at OSU involved studying scanning tunneling microscopy and optical characterization of organic thin films at cryogenic temperatures. He was a consultant to Lake Shore before joining us in 2011. While here, Dr. Daughton has been the company’s principal investigator working with a team of hardware and software developers on the introduction of our continuous wave THz (CW-THz) based system for materials characterization. Results and observations from his THz-related work have been presented by at various conferences, including the IRMMW-THz conference and the APS March Meeting. In his presentations, Dr. Daughton has addressed how temperature-dependent THz spectroscopies have proven useful in characterizing the electronic properties of this novel materials. Dr. Daughton also works extensively with Lake Shore’s line of cryogenic probe stations, helping customers to configure existing Lake Shore products for a specific application, as well as providing application support for variable temperature measurements.

Birck Nanotechnology Center

Researchers should cite this work as follows:

• David Daughton (2024), "Really Real - When is a lock-in data point valid? How big is my error bar?," https://nanohub.org/resources/38871.

  BibTex | EndNote

1. characterization
2. Lake Shore Cryotronics