Micromagnetics and OOMMF Lecture 3: Advanced Topics

By Michael Joseph Donahue

Applied and Computational Mathematics Division , National Institute of Standards and Technology (NIST), Gathersburg, MD

Published on

Abstract

Common Pitfalls, Working with MIF Files, Command-line Tools, Working with Extensions

Sponsored by

Cite this work

Researchers should cite this work as follows:

  • Michael Joseph Donahue (2020), "Micromagnetics and OOMMF Lecture 3: Advanced Topics," https://nanohub.org/resources/34017.

    BibTex | EndNote

Time

Tags