ECE 595ML Lecture 30.2: Overfit - Analyzing Overfit

By Stanley H. Chan

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Researchers should cite this work as follows:

  • Stanley H. Chan (2020), "ECE 595ML Lecture 30.2: Overfit - Analyzing Overfit," https://nanohub.org/resources/32878.

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Purdue University, West Lafayette, IN

ECE 595ML Lecture 30.2: Overfit - Analyzing Overfit
  • Lecture 30.2: Overfit - Analyzing Overfit 1. Lecture 30.2: Overfit - Analy… 0
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  • Outline 2. Outline 13.813813813813814
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  • Learning Curve 3. Learning Curve 20.353687020353689
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  • Bias-Variance 4. Bias-Variance 434.06740073406741
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  • Bias-Variance with Noise 5. Bias-Variance with Noise 664.23089756423087
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  • Bias-Variance with Noise 6. Bias-Variance with Noise 869.26926926926933
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  • Summary 7. Summary 1264.6646646646648
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