Modeling Sanning Probe Microscopes (SPM)

By Woodward Maxwell1; NNCI Nano2

1. Ventura High School, Ventura, CA 2. National Nanotechnology Coordinated Infrastructure, Georgia Institute of Technology, Atlanta, GA

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Teaching Materials

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Abstract

The Modeling Scanning Probe Microscopes (SPM) lab is designed to show students the principles of how a Scanning Probe Microscope works and how mapping on a smaller scale provides a more detailed view of a surface. Students will use a conductivity apparatus to model the mapping behavior of an SPM. This lab is intended to simulate the tunneling current that is used to image very small objects—on the order of 10 nm or less (at the nanoscale).

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Credits

Woodward Maxwell, Research Experience participant at University of California Santa Barbara; Educator at Ventura High School

Sponsored by

Research Experience for Teachers NSF #EEC-0601939 and National Nanotechnology Coordinated Infrastructure NSF # 1626183

Cite this work

Researchers should cite this work as follows:

  • Woodward Maxwell, NNCI Nano (2020), "Modeling Sanning Probe Microscopes (SPM)," https://nanohub.org/resources/31912.

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Submitter

Nancy Healy

Georgia Insitute of Technology, Atlanta, GA

Tags

  1. characterization
  2. high school
  3. K-12
  4. microscopy
  5. NNCI Educational Materials
  6. scanning probe microscopy (SPM)
  7. tunneling