[Illinois] AMC 2016 workshop: Cryogen-Free Scanning Probe Microscopy: the solution for atomic scale surface science below 10 Kelvin without liquid helium

By Craig Wall

RHK Technology

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Abstract

Advanced Material Characterization Workshop June 7-8 2016
Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign

 

Bio


Craig Wall, RHK Technology

Sponsored by

Platinum sponsors: Anasys, Asylum Research, Denton Vacuum, Keysight, PANalytical, RHK, Rigaku, Shimadzu.
Sponsors: Aerotech, Bruker-AXS, CAMECA, DMS, FEI, Hitachi, Hysitron, IXRF Systems, JEOL, K. J. Lesker,
MidWest Vacuum, Neaspec, Princeton Inst, Raith, Sensofar, Specialty Coating.

Cite this work

Researchers should cite this work as follows:

  • Craig Wall (2016), "[Illinois] AMC 2016 workshop: Cryogen-Free Scanning Probe Microscopy: the solution for atomic scale surface science below 10 Kelvin without liquid helium," https://nanohub.org/resources/24398.

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Submitter

NanoBio Node

University of Illinois at Urbana-Champaign

Tags

  1. AMC 2016
  2. cryogen-free
  3. Illinois
  4. materials science
  5. microscopy
  6. scanning electron microscopy (SEM)