[Illinois] Advanced Materials Characterization Workshop 2015

By Ted Limpoco1; Scott Speakman2; Timothy P. Spila3; Rick Haasch3; Justin Masone4; Kathy Walsh3; Matthew Bresin3

1. Asylum Research and Oxford Instruments 2. PANalyitical, Inc. 3. University of Illinois at Urbana-Champaign 4. Shimadzu Scientific Instruments

In This Workshop

  1. [Illinois] Quantitative Elastic Measurements of High Modulus Materials with Tapping/AM-FM Mode

    Online Presentations | 18 Aug 2015 | Contributor(s): Ted Limpoco

  2. [Illinois] Rutherford Backscattering Spectroscopy

    Online Presentations | 18 Aug 2015 | Contributor(s): Timothy P. Spila

  3. [Illinois] Introduction to Elemental Analysis by ED-XRF

    Online Presentations | 18 Aug 2015 | Contributor(s): Justin Masone

  4. [Illinois] Nano- and Micromechanics

    Online Presentations | 18 Aug 2015 | Contributor(s): Kathy Walsh

  5. [Illinois] An Introduction to Scanning Electron Microscopy and Focused Ion Beam

    Online Presentations | 18 Aug 2015 | Contributor(s): Matthew Bresin

  6. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1

    Online Presentations | 18 Aug 2015 | Contributor(s): Rick Haasch

  7. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2

    Online Presentations | 18 Aug 2015 | Contributor(s): Rick Haasch

  8. [Illinois] Diffraction and Beyond: Thin Film Analysis by X-Ray Scattering with a Multipurpose Diffractometer

    Online Presentations | 18 Aug 2015 | Contributor(s): Scott Speakman

  9. [Illinois] Secondary Ion Mass Spectroscopy

    Online Presentations | 18 Aug 2015 | Contributor(s): Timothy P. Spila