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[Illinois] An Introduction to Scanning Electron Microscopy and Focused Ion Beam

By Matthew Bresin

University of Illinois at Urbana-Champaign

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Category

Online Presentations

Published on

18 Aug 2015

Cite this work

Researchers should cite this work as follows:

Matthew Bresin (2015), "[Illinois] An Introduction to Scanning Electron Microscopy and Focused Ion Beam," https://nanohub.org/resources/22625.

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Submitter

NanoBio Node, Aly Taha

University of Illinois at Urbana-Champaign

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