ECE 695A Lecture 37: Radiation Induced Damage – An overview

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:

  • Introduction and short history of radiation damage
  • Radiation damage in various types of components
  • Sources of radiation
  • A basic calculation and simulation approaches
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 37: Radiation Induced Damage – An overview," https://nanohub.org/resources/17638.

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Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. nanoelectronics
  3. radiation
  4. reliability
ECE 695A Lecture 37: Radiation induced damage – an overview
  • Lecture 36: Radiation induced damage – an overview 1. Lecture 36: Radiation induced … 0
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  • Copyright 2013 2. Copyright 2013 183.0830830830831
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  • Outline 3. Outline 183.68368368368368
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  • Electrical vs. Radiation Induced damage 4. Electrical vs. Radiation Induc… 232.1654988321655
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  • Simulations help estimate radiation sensitivity 5. Simulations help estimate radi… 553.21988655321991
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  • A short history of radiation damage 6. A short history of radiation d… 671.20453787120459
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  • Other aspects of radiation 7. Other aspects of radiation 1075.1751751751751
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  • Outline 8. Outline 1302.8028028028029
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  • TID hardness (trapped charges) of varies widely between classes of ics 9. TID hardness (trapped charges)… 1311.1444778111445
    00:00/00:00
  • TID hardness (trapped charges) of generally improve with scaling 10. TID hardness (trapped charges)… 1367.6343009676343
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  • Technology trends lead to increased soft error sensitivity 11. Technology trends lead to incr… 1409.3093093093094
    00:00/00:00
  • Soft errors in flash memories 12. Soft errors in flash memories 1472.7394060727395
    00:00/00:00
  • Sensitivity of floating gate cell generations 13. Sensitivity of floating gate c… 1739.93993993994
    00:00/00:00
  • Irreversible (hard) error in Flash memories 14. Irreversible (hard) error in F… 1811.3780447113782
    00:00/00:00
  • Irreversible error: SBD like observations 15. Irreversible error: SBD like o… 1992.2922922922924
    00:00/00:00
  • Nomenclature 16. Nomenclature 2052.4190857524191
    00:00/00:00
  • Soft reversible error 17. Soft reversible error 2082.3823823823823
    00:00/00:00
  • Outline 18. Outline 2137.6042709376043
    00:00/00:00
  • Terrestrial Cosmic Rays 19. Terrestrial Cosmic Rays 2139.4728061394731
    00:00/00:00
  • Terrestrial Single-Event Effects Environment: Neutrons, Processing and Packaging Materials 20. Terrestrial Single-Event Effec… 2255.6890223556893
    00:00/00:00
  • Summary: types of radiation errors 21. Summary: types of radiation er… 2326.8601935268603
    00:00/00:00
  • Definition of terms 22. Definition of terms 2361.0276943610279
    00:00/00:00
  • Definition of terms 23. Definition of terms 2480.9476142809476
    00:00/00:00
  • Outline 24. Outline 2690.8575241908575
    00:00/00:00
  • A sample calculation: black wall 25. A sample calculation: black wa… 2761.2612612612616
    00:00/00:00
  • A sample calculation for neutron 26. A sample calculation for neutr… 3075.5755755755758
    00:00/00:00
  • Uniformly photo-generated e-h pairs in Intrinsic Semiconductor 27. Uniformly photo-generated e-h … 3148.9823156489824
    00:00/00:00
  • Localized photo-generated e-h pairs from neutron reaction 28. Localized photo-generated e-h … 3188.0213546880213
    00:00/00:00
  • Simulation Approaches 29. Simulation Approaches 3250.2168835502171
    00:00/00:00
  • Conclusions 30. Conclusions 3274.5745745745749
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  • References 31. References 3381.1478144811481
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