ECE 695A Lecture 30: Breakdown in Dielectrics with Defects

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

View Presentation

Additional materials available (4)

Licensed under Creative Commons BY-NC-SA 2.5.

Category

Online Presentations

Published on

Abstract

Outline:

  • Introduction
  • Theory of pre-existing defects: Thin oxides
  • Theory of pre-existing defects: thick oxides
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 30: Breakdown in Dielectrics with Defects," https://nanohub.org/resources/17486.

    BibTex | EndNote

Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. dielectric breakdown
  3. dielectric materials
  4. nanoelectronics
  5. reliability