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SCALE Single Event Burnout Testing of Power Electronics Devices
Online Presentations | 20 Mar 2024 | Contributor(s):: Arthur F Witulski, Andrew L. Sternberg
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Perspectives on Ion-Induced Power Device Burnout in Space
Online Presentations | 02 Nov 2023 | Contributor(s):: Kenneth F. Galloway, Scooter Ball
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IWCN 2021: Electronic States in 4H-SiC MOS Inversion Layers Considering Crystal Structure Using Empirical Pseudopotential Method
Online Presentations | 15 Jul 2021 | Contributor(s):: Sachika Nagamizo, Hajime Tanaka, Nobuya Mori
In this study, to analyze the electronic states in 4H-SiC MOS inversion layers taking account of this feature, we described the crystal structure of 4H-SiC including the internal channel space using the empirical pseudopotential method, and we calculated the electronic states in the triangular...
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Covalent Defects of Carbon Nanotubes: New Class of High Purity, Indistinguishable Quantum Light Sources
Online Presentations | 02 Jan 2020 | Contributor(s):: Han Htoon
Finally, I will report our most recent Hong-Ou-Mandel quantum optic experiment performed on quantum defects coupled to plasmonic cavities. We were able to realize indistinguishable single photon generation by exploiting the Purcell enhancement of the radiative decay rate of individual...
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Transformative Power Semiconductor Technologies to Impact 21st Century Energy Economy, and Space and Defense Electronics
Online Presentations | 22 Sep 2010 | Contributor(s):: Krishna Shenai
This talk will focus on advanced power semiconductor materials, devices, circuits and systems that are needed in order to address this daunting challenge. Specifically we will discuss emerging silicon and wide bandgap materials and power devices, heterogeneous chip-scale power integration,...
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Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
Online Presentations | 16 Feb 2010 | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...