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SCALE Summer 2023 Research (ASU)
Online Presentations | 19 Sep 2023 | Contributor(s):: Esteban Chacon
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JFETlab: An Online Simulation Tool for Double Gate long channel Symmetrical Si and 4H-SiC JFETs
Tools | 19 Dec 2016 | Contributor(s):: Nikolaos Makris, Matthias Bucher, Farzan Jazaeri
JFETlab is a simulation tool of static and dynamic electrical characteristics ( I-V, G-V, C-V ) of Si and 4H-SiC Junction Field Effect Transistors (JFETs) using temperature and channel concentration depedent material models.
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MEMSLab
Tools | 05 Jun 2013 | Contributor(s):: Oluwatosin Adeosun, Sambit Palit, Ankit Jain, Muhammad Alam, Xin Jin
Simulation suite for electromechanical actuators
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ECE 695A Lecture 17R: Review Questions
Online Presentations | 01 Mar 2013 | Contributor(s):: Muhammad Alam
Review Questions:What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation?Why do people like to use C-V techniques? What method would you use for HCI measurement?HCI does not relax. Why would you still want to use on-the-fly type methods? (Hint: Think about Drain...
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ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics
Online Presentations | 26 Nov 2012 | Contributor(s):: Gerhard Klimeck
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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
Online Presentations | 24 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.
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Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 03: More KITE Setup and Features
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 06: Troubleshooting
Online Presentations | 12 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS: KITE Demo
Online Presentations | 18 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 07: KCON Utility Overview
Online Presentations | 18 Jan 2011 | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
Online Presentations | 18 Jan 2011 | Contributor(s):: Lee Stauffer
Theory of Operation and Measurement Overview
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Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
Online Presentations | 18 Jan 2011 | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
Online Presentations | 18 Jan 2011 | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
Online Presentations | 19 Jan 2011 | Contributor(s):: Lee Stauffer
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Device Characterization with the Keithley 4200-SCS
Courses | 12 Jan 2011 | Contributor(s):: Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
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CV profile with different oxide thickness
Animations | 10 Apr 2010 | Contributor(s):: Saumitra Raj Mehrotra, Gerhard Klimeck
C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures.C-V measurements can...